B Series xrf

The B Series represents the most basic top-down measurement configuration that Bowman offers. The sample stage is a fixed base plate, requiring operators to manually position parts in the desired area for testing. This is accomplished by placing parts into the chamber and using the live video image to align the desired location within the crosshairs on the screen. The sample chamber is the same as the P Series, with the slotted configuration, but without the programmable X-Y sample stage.

The standard configuration includes a single fixed collimator, and the camera has a fixed focal distance. The solid-state PIN detector is included along with our long-life micro-focus x-ray tube. As with all Bowman models, the components can be upgraded to include multiple collimators, variable focal camera, or SDD detector.

Product Specification

Element Range:Aluminium 13 to Uranium 92
X-ray excitation:50 W (50kV and 1mA) micro-focused W anode tube
Detector:Silicon solid state detector with 190eV resolution or better
Number of analysis 
layers and elements:
5 layers (4 layers + base) and 10 elements in each layer with composition analysis of up to 25 elements simultaneously
Filters/Collimators:4 primary filters/single motorized collimators
Focal Depths:Fixed focal depths with laser (optional multi focal)
Digital Pulse Processing:4096 CH digital multi-channel analyser with flexible shaping time. Automatic signal processing including dead time correction and escape peak correction
Computer:Intel, CORE i5 3470 Processor (3.2GHz), 8GB DDR3 Memory, Microsoft Windows 10 Prof, 64-bit equivalent
Camera optics:1/4″ CMOS-1280×720 VGA resolution
Power Supply:150W, 100-240 volts, with frequency range of 47Hz to 63Hz
Standard Motorized/ Programmable XY:Table size: Not available
Extended Programmable XY:Table size: Not available
Internal Dimensions:Height: 140mm (5.5″), Width: 310mm (12″), Depth: 335mm (13″)
External Dimensions:Height: 450mm (18″), Width: 450mm (18″), Depth: 600mm ( 24″)