For the physical characterization of particles Microtrac offers a range of optical particle analyzers. Microtrac is the only worldwide supplier of dynamic image analysis, static image analysis, laser diffraction and sieve analysis equipment with an extensive understanding of the strengths and weaknesses of each method.
Dynamic Light Scattering / Zeta Potential
SIEVE ANALYSIS, LASER DIFFRACTION, STATIC OR DYNAMIC IMAGE ANALYSIS?COMPARISON OF MEASUREMENT TECHNIQUES
Dynamic ImageAnalysis (DIA) | Static ImageAnalysis | Sieve Analysis(Retsch) | Laser Diffraction | Dynamic LightScattering (DLS) | ||
Wide dynamic measurement range | ||||||
Reproducibility and repeatability | ||||||
High resolution for narrow distributions | ||||||
Particle shape analysis | ||||||
Direct measurement technique | ||||||
Reliable detection of oversized grains | ||||||
Robust hardware,easy operation for routine analysis | ||||||
Analysis of individual particles | ||||||
High measurement speed,short measurement times | ||||||
Analysis of nano particles | ||||||
Analysis of Zeta potentialand molecular weight | ||||||
Versatility | ||||||
Measuring range | 0.8 µm - 135 mm | 0.5 µm – 1.5 mm | 10 µm - 125 mm | 10 nm – 5 mm | 0.8 nm - 6500 nm |