For the physical characterization of particles Microtrac offers a range of optical particle analyzers. Microtrac is the only worldwide supplier of dynamic image analysis, static image analysis, laser diffraction and sieve analysis equipment with an extensive understanding of the strengths and weaknesses of each method.

Laser Diffraction

Dynamic Light Scattering / Zeta Potential

Static Image Analysis

SIEVE ANALYSIS, LASER DIFFRACTION, STATIC OR DYNAMIC IMAGE ANALYSIS?COMPARISON OF MEASUREMENT TECHNIQUES

	Dynamic ImageAnalysis (DIA)	Static ImageAnalysis	Sieve Analysis(Retsch)	Laser Diffraction	Dynamic LightScattering (DLS)
Wide dynamic measurement range
Reproducibility and repeatability
High resolution for narrow distributions
Particle shape analysis
Direct measurement technique
Reliable detection of oversized grains
Robust hardware,easy operation for routine analysis
Analysis of individual particles
High measurement speed,short measurement times
Analysis of nano particles
Analysis of Zeta potentialand molecular weight
Versatility
Measuring range	0.8 µm - 135 mm	0.5 µm – 1.5 mm	10 µm - 125 mm	10 nm – 5 mm	0.8 nm - 6500 nm

Microtrac strives to provide you with innovative, reliable, and repeatable particle size, shape and charge instrumentation.

Particle analysis instruments are used in virtually every industry, from pharmaceutical to food processing. Our instruments have even been used in the analysis of interplanetary materials like moon rock.

Microtrac particle characterization instruments are used by top industry professionals to conduct the following analysis:

Particle Size Measurements
Zeta Potential Analysis
3-D Image Analysis
Molecular Weight
Dust Characterization

Whether you are new to the industry or a seasoned veteran, we can help you find a solution to fit your specific needs at Microtrac.

New Size and Shape Particle Analyzer Announced!

Microtrac announced a new instrument at Pittcon 2018! The new Microtrac Sync will provide customers with more information about their particles than ever before. By integrating the world’s leading laser diffraction technology with the leading dynamic image analysis on the same bench with the same GUI, Microtrac’s Sync is synchronizing size and shape measurement – one sample, one bench, one sample flow path, one sample cell, one analysis. Size alone is not good enough anymore.

Sync

Laser Diffraction Systems

Since the release of the 7991 in 1974, the first commercially available particle size analyzer, Microtrac has been at the forefront of delivering laser diffraction systems.

Bluewave

S3500

Tri-Blue

Dynamic Light Scattering Systems

Since the release of the UPA in 1990, Microtrac would go on to become the preferred manufacturer of Dynamic Light Scattering instruments for nano-particle measurements.

Nanotrac Wave II

Nanotrac Wave II Q

Nanotrac Flex

Image Analysis System

Whether you are searching for basic image analysis, 3D image analysis, or Online image analysis capability, Microtrac has a particle image analyzer to fit your needs.

SI to S3500

PartAn Mini

PartAn 3D

Application Center

Having over 35 years of particle characterization experience, Microtrac has developed an extensive library of Application Notes.Please click on the title link of an application note to download a PDF file and view the complete note of interest.

Webinar Library

Stay up-to-date with Microtrac's particle characterization presentations.